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Volumn 174-175, Issue , 2003, Pages 744-753

Low-stress superhard Ti-B films prepared by magnetron sputtering

Author keywords

Macrostress; Magnetron sputtering; Structure; Superhard films; Ti B alloy

Indexed keywords

CURRENT DENSITY; ELASTIC MODULI; FILM GROWTH; FILMS; INDENTATION; ION BOMBARDMENT; LIGHT REFLECTION; MAGNETRON SPUTTERING; MICROHARDNESS; POISSON RATIO; STOICHIOMETRY; TEMPERATURE; VICKERS HARDNESS TESTING; X RAY DIFFRACTION ANALYSIS;

EID: 0043241775     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(03)00425-0     Document Type: Article
Times cited : (105)

References (33)
  • 17
    • 0041880777 scopus 로고    scopus 로고
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards, International Center for Diffraction Data, Swarthmore, PA, Card 35-0741
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards, International Center for Diffraction Data, Swarthmore, PA, Card 35-0741
  • 25
    • 0041379952 scopus 로고    scopus 로고
    • Effect of the substrate thermal expansion coefficient on the thermal residual stresses in W-Si-N sputtered films
    • April 9-11, 2001, Coimbra, Portugal, Paper No. TA1C3, Tuesday, April 10
    • C. Louro, F. Teixeira-Dias, L.F. Menezes, A. Cavaleiro, Effect of the substrate thermal expansion coefficient on the thermal residual stresses in W-Si-N sputtered films, 1st International Symposium of Materials, April 9-11, 2001, Coimbra, Portugal, Paper No. TA1C3, Tuesday, April 10, 2001
    • (2001) 1st International Symposium of Materials
    • Louro, C.1    Teixeira-Dias, F.2    Menezes, L.F.3    Cavaleiro, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.