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Volumn B54, Issue 1-2, 1998, Pages 18-23

Proton-implantation-induced optical phenomena in SiO2:GeO2 glasses: Formation of photosensitive defects and nanometer sized Ge crystals

Author keywords

Photosensitive defects; Proton implanation; SiO2:GeO2 glasses

Indexed keywords

GERMANIUM COMPOUNDS; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; OXIDES; PHOTOSENSITIVITY; PROTONS; SILICA;

EID: 0043236281     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5107(98)00017-8     Document Type: Article
Times cited : (5)

References (26)
  • 21
    • 84968184811 scopus 로고
    • SPIE, Bellingham, WA
    • T.E. Tsai, D.L. Griscom, SPIE, Vol. 1516, SPIE, Bellingham, WA, 1991, p. 14.
    • (1991) SPIE , vol.1516 , pp. 14
    • Tsai, T.E.1    Griscom, D.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.