Importance of wheat grain orientation for the detection of internal mechanical damage by the X-ray method

International Agrophysics

Volumn 13, Issue 3, 1999, Pages 355-361

  Grundas, S ^a   Velikanov, L ^a   Archipov, M ^b  

^a INSTITUTE OF AGROPHYSICS   (Poland)

^b AGROPHYSICAL RESEARCH INSTITUTE   (Russian Federation)

Author keywords

Grain and sample orientation; Internal damage; Roentgenograph projection; Wheat grain

Indexed keywords

EID: 0043233347     PISSN: 02368722     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. Grundas S., Velikanov L.: Methodical and technological aspects of X-ray imaging of wheat grain. Book of Abstracts of the 16th ICC Conference, May 8-12. 1998, Vienna, Austria, 1998.
2. Grundas S., Velikanov L., Szwed G., Łukaszuk J.: X-ray instrument attachment for 3-D visualisation of inner damage of seeds (in Polish). Polish Patent Office, W-86953/1992.
3. Niewczas J., Grundas S., Ślipek Z.: The analysis of increments of internal damage to wheat grain affected by dynamic loading. Int. Agrophysics, 8, 2, 283-287, 1994.
4. Strumillo P., Grundas S.: X-ray imaging for grain diagnostic. Book of Abstracts of the 16th ICC Conference, May 8-12.1998, Vienna, Austria, 1998.
5. Velikanov L.: Some aspects of X-ray method for evaluation of wheat grain geometrical features. Book of Abstracts of the 6th ICA, September 15-18.1997, Lublin, Poland, 1997.
6. Velikanov L., Geodecki M., Grundas S., Niewczas J.: Some biological effects of static loading applied to grain mass of differentiated moisture content. Part II. Zesz. Probl. Post. Nauk Roln., 399, 267-271, 1994.
7. Woźniak W., Styk W., Geodecki M.: High relative humidity as a cause of inner damage of wheat grain. Int. Agrophysics, 8, 2, 377-381, 1994.