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Volumn 6, Issue 10, 1997, Pages 1456-1458
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Preferential etching of SiC crystals
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Author keywords
Chemical; Defects; Etching; Preferential; SiC
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Indexed keywords
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EID: 0043229552
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-9635(97)00076-9 Document Type: Article |
Times cited : (45)
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References (5)
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