Dependence of crystalline orientation on film thickness of sputtered YBa2Cu3O 7-x on an MgO substrate

Physica C: Superconductivity and its Applications

Volumn 392-396, Issue PART 2, 2003, Pages 1276-1280

  Nakamura, Y ^a   Kudo, S ^a   Mukaida, M ^b   Ohshima, S ^b  

^a HACHINOHE NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^b YAMAGATA UNIVERSITY   (Japan)

Author keywords

a axis orientation; c axis orientation; Film thickness; Orientation transition; YBa2Cu3Ox thin film

Indexed keywords

CRYSTAL ORIENTATION; MAGNESIA; SPUTTERING; SUBSTRATES; SURFACES; X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES;

FILM THICKNESS;

SUPERCONDUCTING FILMS;

EID: 0043192751     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(03)00777-9     Document Type: Conference Paper

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