Microwave dielectric characteristics of 0.75(Al1/2 Ta1/2)O2-0.25(Ti1-xSnx) O2 ceramics

Journal of the European Ceramic Society

Volumn 23, Issue 14, 2003, Pages 2507-2510

  Choi, Ji Won ^a   Ha, Jong Yoon ^a   Yoon, Seok Jin ^a   Kim, Hyun Jai ^a   Yoon, Ki Hyun ^b  

^a Korea Institute of Science and Technology   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

(Al,Ta)O2; (Ti,Sn)O2; Dielectric constant; Microwave ceramics; Quality factor

Indexed keywords

ALUMINUM COMPOUNDS; DIELECTRIC MATERIALS; MICROSTRUCTURE; PERMITTIVITY;

MICROWAVE DIELECTRICS;

MICROWAVE DEVICES;

CERAMICS; DIELECTRIC PROPERTY; MICROWAVE RADIATION;

EID: 0043192521     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(03)00170-5     Document Type: Article

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