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Volumn 50, Issue 5, 2003, Pages 1194-1199

An improved GaAs device model for the simulation of analog integrated circuit

Author keywords

Device model; Drain lag; Equivalent circuit; Frequency dispersion; GaAs; HFET; MESFET

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC CURRENTS; EQUIVALENT CIRCUITS; FIELD EFFECT TRANSISTORS; HETEROJUNCTIONS; INTEGRATED CIRCUIT LAYOUT; MESFET DEVICES; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MODELS; TRANSCONDUCTANCE;

EID: 0043175239     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2003.813234     Document Type: Article
Times cited : (13)

References (6)
  • 1
    • 0019020915 scopus 로고
    • A MESFET model for use in the design of GaAs integrated circuits
    • May
    • W. R. Curtice, "A MESFET model for use in the design of GaAs integrated circuits," IEEE Trans. Microwave Theory Techn., vol. MTT-28, pp. 4448-455, May 1980.
    • (1980) IEEE Trans. Microwave Theory Techn. , vol.MTT-28 , pp. 448-455
    • Curtice, W.R.1
  • 2
    • 0022059446 scopus 로고
    • A capacitance model for GaAs MESFET's
    • May
    • T.-H. Chen and M. S. Shur, "A capacitance model for GaAs MESFET's," IEEE Trans. Electron Devices, vol. ED-12, pp. 883-891, May 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-12 , pp. 883-891
    • Chen, T.-H.1    Shur, M.S.2
  • 3
    • 0020125695 scopus 로고
    • A MESFET variable-capacitance model for GaAs integrated circuits simulation
    • May
    • T. Takada, K. Yokoyama, M. Ida, and T. Sudo, "A MESFET variable-capacitance model for GaAs integrated circuits simulation," IEEE Trans. Microwave Theory Tech., vol. MTT-30, pp. 719-723, May 1982.
    • (1982) IEEE Trans. Microwave Theory Tech. , vol.MTT-30 , pp. 719-723
    • Takada, T.1    Yokoyama, K.2    Ida, M.3    Sudo, T.4
  • 4
    • 0023401685 scopus 로고
    • An improved GaAs MESFET equivalent circuit model for analog integrated circuit applications
    • Aug.
    • L. E. Larson, "An improved GaAs MESFET equivalent circuit model for analog integrated circuit applications," IEEE J. Solid-State Circuits, vol. SC-22, pp. 567-574, Aug. 1987.
    • (1987) IEEE J. Solid-State Circuits , vol.SC-22 , pp. 567-574
    • Larson, L.E.1
  • 5
    • 0030242727 scopus 로고    scopus 로고
    • A large-signal equivalent circuit model for substrate-induced drain-lag phenomena in HJFETs
    • Sept.
    • K. Kunihiro and Y. Ohno, "A large-signal equivalent circuit model for substrate-induced drain-lag phenomena in HJFETs," IEEE Trans. Electron Devices, vol. 43, pp. 1336-1342, Sept. 1996.
    • (1996) IEEE Trans. Electron Devices , vol.43 , pp. 1336-1342
    • Kunihiro, K.1    Ohno, Y.2
  • 6
    • 0025508044 scopus 로고
    • A self-backgating GaAs MESFET model for low-frequency anomalies
    • Oct.
    • M. Lee and L. Forbes, "A self-backgating GaAs MESFET model for low-frequency anomalies," IEEE Trans. Electron Devices, vol. 37, pp. 2148-2157, Oct. 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 2148-2157
    • Lee, M.1    Forbes, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.