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Volumn 77, Issue 3-4, 2003, Pages 603-606
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Trapping centers in undoped GaS layered single crystals
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCULATIONS;
CRYSTAL GROWTH;
ELECTRIC CURRENT MEASUREMENT;
ELECTRON TRAPS;
SINGLE CRYSTALS;
THERMAL EFFECTS;
BRIDGMAN TECHNIQUE;
GALLIUM SULFIDE;
THERMALLY STIMULATED CURRENT MEASUREMENTS;
TRAPPING CENTERS;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 0043159151
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s00339-002-2035-y Document Type: Article |
Times cited : (18)
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References (15)
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