A method for measuring low capacitance for tomography

Review of Scientific Instruments

Volumn 70, Issue 7, 1999, Pages 3177-3179

  Shao, FuQun ^a   Mong, QinGuo ^a  

^a NORTHEASTERN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043136633     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149883     Document Type: Article

References (7)

1. S. M. Huang, C. G. Xie, R. Thorn, D. Snowden, and M. S. Beck, IEE Proc.-G: Circuits, Devices Syst. 139, 83 (1992).
2. W. Q. Yang, A. I. Stott, and M. S. Beck, IEE Proc.-G: Circuits, Devices Syst. 141, 215 (1994).
3. G. E. Fasching, J. L. Wilma, and S. S. Nelson, IEEE Trans Instrum. Meas. 43 (1994).
4. T. Dyakowski, Meas. Sci. Technol. 7, 343 (1996).
5. J. S. Halow and P. Nicoletti, Powder Technol. 69, 255 (1992).
6. O. Isaksen, A. S. Dico, and E. A. Hammer, Meas. Sci. Technol. 5, 1262 (1994).
7. R. He, C. M. Beck, R. C. Waterfall, and M. S. Beck, Proc. 2nd ECAPT Conf. (European Concerted Action on Process Tomography, Karlsruhe 25-27 March), edited by M. S. Beck, E. Campogrande, M. Morris, R. A. Williams, and R. C. Waterfall (Computational Mechanics, Southampton, 1993), pp. 300-302.