Fluctuation effects in the magnetic penetration depth of high-Tc films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2697, Issue , 1996, Pages 211-216

  Lemberger, Thomas R ^a   Ulm, Eric R ^a   Paget, K M ^a   Matijasevic, Vladimir C ^b  

^a OHIO STATE UNIVERSITY   (United States)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Films; Fluctuations; Penetration depth; Superconductivity; YBCO

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DISTANCE MEASUREMENT; ELECTRIC CONDUCTIVITY; OXIDE FILMS; OXIDE SUPERCONDUCTORS; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY; YTTRIUM BARIUM COPPER OXIDES;

FLUCTUATION EFFECTS; FLUCTUATIONS; LINEAR BEHAVIORS; LOW TEMPERATURES; MAGNETIC PENETRATION DEPTHS; PENETRATION DEPTH; PHASE FLUCTUATIONS; SHARP TRANSITIONS; SMBCO FILMS; YBCO;

PENETRATION DEPTH (SUPERCONDUCTIVITY);

EID: 0043131304     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.250283     Document Type: Conference Paper

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