Diagnostics of optical nonlinearities: Spatial beam distortion technique and its application to semiconductors and novel materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5024, Issue , 2003, Pages 128-136

  Borshch, Anatoly ^a   Brodyn, Mikhail ^a   Gayvoronsky, Vladimir ^a  

^a IPNASU   (Ukraine)

Author keywords

Absorption saturation; Epoxy polymer; Nonlinear refraction; Silicon carbide; Two photon absorption; Z scan

Indexed keywords

ENERGY GAP; EPOXY RESINS; LIGHT ABSORPTION; OPTICAL PUMPING; OPTICAL VARIABLES MEASUREMENT; PHOTOCHEMICAL REACTIONS; PHOTONS; REFRACTIVE INDEX; SEMICONDUCTING SILICON; SEMICONDUCTOR MATERIALS; SILICON CARBIDE;

EPOXY POLYMER; INTERBAND TWO PHOTON ABSORPTION; INTRABAND DIRECT EQUILIBRIUM CARRIERS TRANSITION SATURATION; SPATIAL BEAM DISTORTION TECHNIQUE; WIDE GAP SEMICONDUCTORS;

NONLINEAR OPTICS;

EID: 0043127459     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.497191     Document Type: Conference Paper

References (19)

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