Noncontact probing of metal-oxide-semiconductor inversion layer mobility

Applied Physics Letters

Volumn 69, Issue 12, 1996, Pages 1779-1780

  Son, Joo Hiuk ^a,b   Jeong, Seongtae ^a,c   Bokor, Jeffrey ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Hynix Semiconductor Inc   (South Korea)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043122714     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117483     Document Type: Article

References (13)

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