Modeling point diffraction interferometers

Optical Engineering

Volumn 35, Issue 2, 1996, Pages 351-356

  Gong, Qian ^b,c,d   Geary, Joseph M ^a,b,d,e,f,g  

^a SPIE ^*

^b Swales and Associates Inc   (United States)

^c NANKAI UNIVERSITY   (China)

^d UNIVERSITY OF ARIZONA   (United States)

^e AF's High Energy Laser Program

^f United Technologies Optical Systems

^g Swales and Associates

Author keywords

Point diffraction interferometer; Wavefront aberration; Wavefront sensor

Indexed keywords

EID: 0043100276     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.600903     Document Type: Article

References (4)

1. R. Smartt and W. Steel, "Theory and application of point diffraction interferometer," Jpn. J. Appl. Phys. 14 (1975).
2. Ealing Catalog, pp. 444-445 (1994).
3. J. Wyant, "Recent investigation of interferometry and applications to optical testing," Proc. SPIE 190, 351-356 (1979).
4. H. A. Macleod, Thin-film Optical Filters, McGraw-Hill, pp. 41-45.