Ex-situ spectroscopic ellipsometry studies of micron thick CVD diamond films

Diamond and Related Materials

Volumn 5, Issue 12, 1996, Pages 1424-1432

  Cella, N ^a,d   Rhaleb, H El ^a   Roger, J P ^a   Fournier, D ^b   Anger, E ^c   Gicquel, A ^c  

^a CNRS   (France)

^b SORBONNE UNIVERSITÉ   (France)

^c UNIVERSITÉ PARIS 13   (France)

^d STATE UNIVERSITY OF RIO DE JANEIRO   (Brazil)

Author keywords

CVD diamond films; Raman spectroscopy; Roughness; Spectroscopic ellipsometry

Indexed keywords

EID: 0043080087     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(96)00578-X     Document Type: Article

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