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Journal of Applied Physics

Volumn 79, Issue 6, 1996, Pages 3089-3093

Determination of the relative densities of high-voltage stressed-generated traps near the anode and cathode in 10-nm-thick silicon oxides

(2) Hughes, T W a,b Dumin, D J a

a Clemson University (United States)

b TEXAS INSTRUMENTS (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043080054 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.361251 Document Type: Article

Times cited : (8)

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