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Volumn 125, Issue 3, 2003, Pages 283-293

Measurement of thickness-average residual stress near the edge of a thin laser peened strip

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; LASER APPLICATIONS; RESIDUAL STRESSES; SHOT PEENING; STRAIN GAGES; STRESS ANALYSIS;

EID: 0043072817     PISSN: 00944289     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1584481     Document Type: Article
Times cited : (17)

References (11)
  • 1
    • 0033874031 scopus 로고    scopus 로고
    • Effect of power density and pulse repetition on laser shock peening of Ti-6Al-4V
    • Smith, P. R., Shepard, M. J., Prevéy, P. S., and Clauer, A. H., 2000, "Effect of Power Density and Pulse Repetition on Laser Shock Peening of Ti-6Al-4V," J. Mater. Eng. Perform., 9(1), pp. 33-37.
    • (2000) J. Mater. Eng. Perform. , vol.9 , Issue.1 , pp. 33-37
    • Smith, P.R.1    Shepard, M.J.2    Prevéy, P.S.3    Clauer, A.H.4
  • 2
    • 0002457745 scopus 로고    scopus 로고
    • Residual stress measurement by successive extension of a slot: The crack compliance method
    • Prime. M. B., 1999, "Residual Stress Measurement by Successive Extension of a Slot: The Crack Compliance Method," Appl. Mech. Rev., 52(2), pp. 75-96.
    • (1999) Appl. Mech. Rev. , vol.52 , Issue.2 , pp. 75-96
    • Prime, M.B.1
  • 3
    • 0012540877 scopus 로고    scopus 로고
    • Residual stress measurement in a ceramic-metallic graded material
    • Hill, M. R., and Lin, W., 2002, "Residual Stress Measurement in a Ceramic-Metallic Graded Material," ASME J. Eng. Mater. Technol., 124(2), pp. 185-191.
    • (2002) ASME J. Eng. Mater. Technol. , vol.124 , Issue.2 , pp. 185-191
    • Hill, M.R.1    Lin, W.2
  • 4
    • 0029185057 scopus 로고
    • Design and operation of a 150 W near diffraction-limited laser amplifier with SBS wavefront correction
    • Dane, C. B., Zapata, L. E., Neuman, W. A., Norton, M. A., and Hackel, L. A., 1995, "Design and Operation of a 150 W Near Diffraction-Limited Laser Amplifier With SBS Wavefront Correction," IEEE J. Quantum Electron., 31(1), pp. 148-163.
    • (1995) IEEE J. Quantum Electron. , vol.31 , Issue.1 , pp. 148-163
    • Dane, C.B.1    Zapata, L.E.2    Neuman, W.A.3    Norton, M.A.4    Hackel, L.A.5
  • 5
    • 0034290097 scopus 로고    scopus 로고
    • Surface prestressing to improve fatigue strength of components by laser shot peening
    • Hammersley, G., Hackel, L. A., and Harris, F., 2000, "Surface Prestressing to Improve Fatigue Strength of Components by Laser Shot Peening," Opt. Lasers Eng., 34(4-6), pp. 327-337.
    • (2000) Opt. Lasers Eng. , vol.34 , Issue.4-6 , pp. 327-337
    • Hammersley, G.1    Hackel, L.A.2    Harris, F.3
  • 9
    • 0028319420 scopus 로고
    • Measurement of near surface residual stresses using electrical discharge wire machining
    • Cheng, W., Finnie, I., Gremaud, M., and Prime, M. B., 1994, "Measurement of Near Surface Residual Stresses Using Electrical Discharge Wire Machining," ASME J. Eng. Mater. Technol., 116. pp. 1-7.
    • (1994) ASME J. Eng. Mater. Technol. , vol.116 , pp. 1-7
    • Cheng, W.1    Finnie, I.2    Gremaud, M.3    Prime, M.B.4
  • 10
    • 0001013204 scopus 로고
    • Correction of stress layers in x-ray diffraction residual stress analysis
    • Moore, M. G., and Evans, W. P., 1958, "Correction of Stress Layers in X-Ray Diffraction Residual Stress Analysis," SAE Trans., 66, pp. 340-345.
    • (1958) SAE Trans. , vol.66 , pp. 340-345
    • Moore, M.G.1    Evans, W.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.