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Volumn 255, Issue 1-6, 2003, Pages 385-394

Characterisation of engineered surfaces by a novel four-in-one tribological probe microscope

Author keywords

Elastic modulus and topography; Measurements of friction; Micro nanotribology; Multi function surface characterisation; Nanohardness; Scanning probe microscopy

Indexed keywords

DEFORMATION; ELASTIC MODULI; FRICTION; HARDNESS; LOADS (FORCES); MICROSCOPIC EXAMINATION; SURFACE TOPOGRAPHY;

EID: 0043071269     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(03)00227-8     Document Type: Article
Times cited : (20)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.