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Volumn 36, Issue 4, 1997, Pages 1191-1195

All-optical probing of material structure by second-harmonic generation: Application to piezoelectric aluminum nitride thin films

Author keywords

Optical diagnostic; Piezoelectricity; Second harmonic generation; Thin film characterization

Indexed keywords


EID: 0043037617     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601240     Document Type: Article
Times cited : (6)

References (14)
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    • Second harmonic generation studies of interfacial structure and dynamics
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  • 6
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    • Characterization of aluminium nitride thin film structure using second-harmonic generation
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  • 7
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    • Maker fringes revisited: Second-harmonic generation from birefringent or absorbing materials
    • W. N. Herman and L. M. Hayden, "Maker fringes revisited: second-harmonic generation from birefringent or absorbing materials," J. Opt. Soc. Am. 12(3), 416-427 (1995).
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  • 8
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  • 9
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  • 10
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    • Second order optical nonlinearities of radio frequency sputter-deposited AlN thin films
    • W. P. Lin, P. M. Lundquist, G. K. Wong, E. D. Rippert, and J. B. Kettrson, "Second order optical nonlinearities of radio frequency sputter-deposited AlN thin films," Appl. Phys. Lett. 63(21), 2875-2877 (1993).
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  • 12
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    • Societe Française du Vide and Deutsche Vakuum Gesellschaft, Colmar, France April
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  • 13
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.