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Volumn 13, Issue 2 II, 2003, Pages 2036-2039
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Modeling of the transient behavior of a resistive type high Tc fault current limiter
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Author keywords
Pspice; SFCL; Skin effect; Transient modeling
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Indexed keywords
BISMUTH;
COMPUTER SIMULATION;
ELECTRIC FAULT CURRENTS;
ELECTRIC POWER SYSTEMS;
ELECTRIC RESISTANCE;
ELECTRIC WINDINGS;
LIGHTNING;
LIMITERS;
LUMPED PARAMETER NETWORKS;
SKIN EFFECT;
TRANSIENTS;
TRAVELING WAVES;
SUPERCONDUCTING DEVICES;
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EID: 0042974902
PISSN: 10518223
EISSN: None
Source Type: Journal
DOI: 10.1109/TASC.2003.812978 Document Type: Conference Paper |
Times cited : (6)
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References (5)
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