Optical metrology for analysis of lobster–eye x–ray optics

Applied Optics

Volumn 42, Issue 13, 2003, Pages 2422-2430

  Irving, Thomas H K ^a   Peele, Andrew G ^a   Nugent, Keith A ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; IMAGE ANALYSIS; OPTICAL MICROSCOPY; SURFACE ROUGHNESS;

OPTICAL METROLOGY;

X RAY OPTICS;

EID: 0042973155     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.002422     Document Type: Article

References (23)

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