Structural characterization of epitaxial YBCO thin films prepared by a fluorine-free sol-gel method for coated conductors

Superconductor Science and Technology

Volumn 16, Issue 8, 2003, Pages 838-844

  Lian, Jie ^a   Yao, Haibo ^b   Shi, Donglu ^c   Wang, Lumin ^a   Xu, Yongli ^c   Liu, Qing ^b   Han, Z ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b TSINGHUA UNIVERSITY   (China)

^c University of Cincinnati   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; PARTIAL PRESSURE; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SOL-GELS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES;

COATED CONDUCTORS;

THIN FILMS;

EID: 0042967654     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/16/8/302     Document Type: Article

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