Characterization of large defects in alumina

American Ceramic Society Bulletin

Volumn 82, Issue 4, 2003, Pages 39-42

  Sato, K ^a   Tanaka, S ^a   Uchida, N ^a   Uematsu, K ^a   Abe, H ^b   Naito, M ^b   Hotta, T ^c   Shinohara, N ^d  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c JAPAN FINE CERAMICS CENTER   (Japan)

^d ASAHI GLASS CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; GRINDING (COMMINUTION); OPTICAL MICROSCOPY; POLISHING; REFLECTION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SINTERING; SPUTTERING; TRANSPARENCY;

ALUMINA GRADE; DIAMOND CUTTER; TRANSMISSION OPTICAL MICROSCOPY;

ALUMINA;

EID: 0042965704     PISSN: 00027812     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (0)