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Volumn 119, Issue 6, 2000, Pages 3071-3083
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Speckle interferometry at the US naval observatory. V.
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Author keywords
Binaries: General; Binaries: Visual; Techniques: Interferometric
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Indexed keywords
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EID: 0042960450
PISSN: 00046256
EISSN: None
Source Type: Journal
DOI: 10.1086/301373 Document Type: Article |
Times cited : (18)
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References (7)
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