Syntheses and characterization of new tertiary phosphane ligands prepared from p-anisyl- and p-thioanisyldichlorophosphanes

European Journal of Inorganic Chemistry

Volumn , Issue 8, 1999, Pages 1253-1258

  Laitinen, Riitta H ^a   Riihimäki, Helena ^a   Haukka, Matti ^b   Jääskeläinen, Sirpa ^b   Pakkanen, Tapani A ^b   Pursiainen, Jouni ^a  

^a UNIVERSITY OF OULU   (Finland)

^b UNIVERSITY OF EASTERN FINLAND   (Finland)

Author keywords

31P NMR spectrometry; Electronic and steric properties; Phosphane ligands; Substituent increments

Indexed keywords

SINGLE CRYSTALS;

31P-NMR SPECTROMETRY; ELECTRONIC AND STERIC PROPERTY; NMR SPECTROMETRY; PHOSPHANE LIGANDS; SPECTROSCOPIC PARAMETERS; STERIC PROPERTIES; SUBSTITUENT INCREMENT; SYNTHESIS AND CHARACTERIZATIONS; SYNTHESIS PARAMETERS; TERTIARY PHOSPHANES;

LIGANDS;

LIGAND; PHOSPHINE DERIVATIVE; PHOSPHORUS 31;

ARTICLE; CRYSTAL STRUCTURE; PHOSPHORUS NUCLEAR MAGNETIC RESONANCE; STRUCTURE ANALYSIS; SYNTHESIS; X RAY ANALYSIS;

EID: 0042942304     PISSN: 14341948     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1099-0682(199908)1999:8<1253::aid-ejic1253>3.0.co;2-h     Document Type: Article

References (34)

1. C. A. Tolman, Chem. Rev. 1977, 77, 313-348.
2. C. A. Tolman, J. Am. Chem. Soc. 1970, 92, 2953-2956.
3. C. A. Tolman, J. Am. Chem. Soc. 1970, 92, 2956-2965.
4. C. J. Elsevier, B. Kowall, H. Kragten, Inorg. Chem. 1995, 34, 4836-4839.
5. S. Song, E. C. Alyea, Can. J. Chem. 1996, 74, 2304-2320.
6. T. L. Brown, K. J. Lee, Coord. Chem. Rev. 1993, 128, 89-116.
7. J. M. Smith, B. C. Taverner, N. J. Coville, J. Organomet. Chem. 1997, 530, 131-140.
8. J. A. Miles, M. T. Beeny, K. W. Ratts, J. Org. Chem. 1975, 40, 343-347.
9. R. G. Jones, H. Gilman, Org. React. 1951, 6, 339-356.
10. L. Hirsivaara, M. Haukka, S. Jääskeläinen, R. H. Laitinen, E. Niskanen, T. A. Pakkanen, J. Pursiainen, J. Organomet. Chem., in press.
11. L. Hirsivaara et al., to be published.
12. K. R. Dunbar, J. S. Sun, S. C. Haefner, J. H. Matonic, Organometallics 1994, 13, 2713-2720.
13. J. P. Farr, M. M. Olmstead, A. L. Balch, J. Am. Chem. Soc. 1980, 102, 6654-6656.
14. A. Maisonnet, J. P. Farr, M. M. Olmstead, C. T. Hunt, A. L. Balch, Inorg. Chem. 1982, 21, 3961-3967.
15. A. S. C. Chan, C. C. Chen, R. Cao, M. R. Lee, S. M. Peng, G. H. Lee, Organometallics 1997, 16, 3469-3473.
16. J. G. Verkade, L. D. Quin (Eds.), Phosphorus-31 NMR Spectroscopv in Stereochemical Analysis, VCH Publishers, Inc., Deerfield Beach, FL, U.S.A., 1987, p. 88-92.
17. S. O. Grim, W. McFarlane, E. F. Davidoff, J. Org. Chem 1967, 31, 781-784.
18. P. Suomalainen, R. H. Laitinen et al., to be published.
19. S. O. Grim, A. W. Yankowsky, Phosphorus and Sulfur 1977, 3, 191-195.
20. Y. Yamashoji, T. Matsushita, M. Tanaka, T. Shono, Polyhedron 1989, 8, 1053-1059.
21. R. J. Bowen, A. C. Garner, S. J. Berners-Price, I. D. Jenkins, R. E. Sue, J. Organomet. Chem. 1998, 554, 181-184.
22. T. Allman, R. G. Goel, Can. J. Chem. 1982, 60, 716-722.
23. T. T. Derencsenyi, Inorg. Chem. 1981, 20, 665-670.
24. C. A. Streuli, Anal. Chem. 1960, 32, 985-987.
25. A. Michaelis, Annalen 1896, 293, 249-257.
26. W. C. Davies, F. G. Mann, J. Chem. Soc. 1944, 276-283.
27. P3/P4 Diffractometer Program V4.27, Siemens Analytical X-ray Instruments, 1989-1991.
28. Collect, Data collection software, Enraf-Nonius, Delft, The Netherlands, 1998.
29. Z. Otwinowski, W. Minor, Processing of X-ray Diffraction Data Collected in Oscillation Mode, Methods in Enzymology, Vol. 276, Macromolecular Crystallography, Part A (Eds.: C. W. Carter, Jr., R. M. Sweet), Academic Press, 1997, p. 307-326.
30. G. M. Sheldrick, SHELXS-97, Program for Crystal Structure Determination, University of Göttingen, Germany, 1997.
31. A. Altomare, C. Cascarano, C. Giacovazzo, A. Guagliardi, A. G. G. Moliterni, M. C. Burna, G. Polidori, M. Camalli, R. Spagna, SIR-97, A Package for Crystal Structure Solution by Direct Methods and Refinement, University of Bari, Italy, 1997.
32. L. J. Farrugia, WinGX - A Windows Program for Crystal Structure Analysis, University of Glasgow, Scotland, 1998.
33. G. M. Sheldrick, SHELXTL Version 5.1, Bruker Analytical X-ray Systems, Inc., Madison, Wisconsin, USA, 1998.
34. G. M. Sheldrick, SHELXL-97, Program for Crystal Structure Refinement, University of Göttingen, Germany, 1997.