Advanced thin wafer IGBTs with new thermal management solution

IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD)

Volumn , Issue , 2003, Pages 144-147

  Otsuki, M ^a   Kanemaru, H ^b   Ikeda, Y ^b   Ueno, K ^b   Kirisawa, M ^b   Onozawa, Y ^b   Seki, Y ^b  

^a Fuji Hitachi Pwr Semiconduct CL   (Japan)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRODES; SHORT CIRCUIT CURRENTS; SWITCHING; THERMAL EFFECTS;

THERMAL MANAGEMENT;

INSULATED GATE BIPOLAR TRANSISTORS;

EID: 0042941398     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. th ISPSD, pp.355-358, June 2000.
2. th ISPSD, pp.285-288, 2002.
3. th ISPSD, pp.281-284, 2002.