Aging measurements on glass RPCs

IEEE Transactions on Nuclear Science

Volumn 50, Issue 4 II, 2003, Pages 820-824

  Ambrosio, M ^a   Candela, A ^b   De Deo, M ^b   D'Incecco, M ^b   Gamba, D ^c   Giuliano, A ^d   Gustavino, C ^b   Lindozzi, M ^b   Morganti, S ^e   Redaelli, N ^f   Tonazzo, A ^f,g   Trapani, P ^c   Trinchero, G C ^d  

^a INFN SEZIONE DI NAPOLI   (Italy)

^b LABORATORI NAZIONALI DEL GRAN SASSO   (Italy)

^c UNIVERSITY OF TURIN   (Italy)

^d SEZIONE DI TORINO   (Italy)

^e SAPIENZA UNIVERSITY OF ROME   (Italy)

^f UNIVERSITY OF MILANO BICOCCA   (Italy)

^g INFN SEZIONE DI ROMA   (Italy)

Author keywords

Aging; Glass; Resistive plate chambers (RPCs)

Indexed keywords

CONTAMINATION; ELECTRIC POTENTIAL; ELECTRODES; SCREEN PRINTING;

RESISTIVE PLATE CHAMBERS (RPC);

PARTICLE DETECTORS;

EID: 0042928278     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.814563     Document Type: Conference Paper

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