The evaluation of normalized cross correlations for defect detection

Pattern Recognition Letters

Volumn 24, Issue 15, 2003, Pages 2525-2535

  Tsai, Du Ming ^a   Lin, Chien Ta ^a   Chen, Jeng Fung ^b  

^a YUAN ZE UNIVERSITY   (Taiwan)

^b FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Color images; Defect detection; Normalized cross correlation; Smoothing

Indexed keywords

COLOR IMAGE PROCESSING; CORRELATION DETECTORS; INSPECTION;

NORMALIZED CROSS CORRELATION (NCC);

PATTERN RECOGNITION;

DEFECT; PATTERN RECOGNITION;

EID: 0042878501     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(03)00098-9     Document Type: Article

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