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Volumn 81, Issue 1, 1997, Pages 324-327

Critical temperature depth profiling and improvement of YBa2Cu3O7 weak links produced by ion modification

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Indexed keywords


EID: 0042878326     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364113     Document Type: Article
Times cited : (10)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.