Scanning near-field optical microscopy by near-field reflectance enhancement: A versatile and valid technique

Journal of Physical Organic Chemistry

Volumn 12, Issue 2, 1999, Pages 141-143

  Kaupp, Gerd ^a   Herrmann, Andreas ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

Broken tip artefacts; Chemical contrast; Near field reflectance; Scanning near field optical microscopy; Sharp tips; Submicroscopic resolution

Indexed keywords

EID: 0042876176     PISSN: 08943230     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1395(199902)12:2<141::AID-POC101>3.0.CO;2-N     Document Type: Article

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