Measurements of small-scale fading and path loss for long range RF tags

IEEE Transactions on Antennas and Propagation

Volumn 51, Issue 8, 2003, Pages 1740-1749

  Kim, Daeyoung ^a,b   Ingram, Mary Ann ^a   Smith Jr , W Whit ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b SAMSUNG Electronics   (South Korea)

Author keywords

Electronic shelf tag; Modulated backscatter; Multipath fading; Path loss; Reflection antennas; RF tag

Indexed keywords

ANTENNAS; BACKSCATTERING; MODULATION; RADAR; SIGNAL RECEIVERS;

MULTIPATH FADING;

WAVE PROPAGATION;

EID: 0042865754     PISSN: 0018926X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TAP.2003.814752     Document Type: Article

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