Modeling of electric double layer effects through pressure-driven microchannel flows

CMES - Computer Modeling in Engineering and Sciences

Volumn 3, Issue 3, 2002, Pages 351-365

  Ng, E Y K ^a   Poh, S T ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b Milling Systems and Concepts Ltd   (Singapore)

Author keywords

EDL effects; FVM; Microchannel; Pressure driven flows; Simulation

Indexed keywords

EID: 0042850519     PISSN: 15261492     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (18)

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