Interaction of thiadiazole additives with metal surfaces: Reactions and thin-film formation on gold as a model surface

Langmuir

Volumn 19, Issue 15, 2003, Pages 6072-6080

  Hipler, Frank ^a   Gil Girol, Stefanie ^a   Azzam, Waleed ^a   Fischer, Roland A ^a   Woll, Christof ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; COMPUTATIONAL METHODS; GOLD; INFRARED SPECTROSCOPY; MASS SPECTROMETRY; METALLIC FILMS; POLYCRYSTALLINE MATERIALS; SCANNING TUNNELING MICROSCOPY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

TAUTOMERS;

ORGANIC COMPOUNDS;

EID: 0042843580     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0209031     Document Type: Article

References (29)

1. Shouji, E.; Buttry, D. A. J. Phys. Chem. B 1998, 205, 1444.
2. Kornis, G. 1,3,4-Thiadiazoles. In Comprehensive Heterocydic Chemistry; Katritzky, A. R., Rees, C. W., Eds.;Pergamon Press: Oxford, 1984; Vol. 6, Part 4B, p 545.
3. Hipler, F.; Gil Girol, S.; Fischer, R. A.; Wöll, Ch. Mat.-Wisa. U. Werkstofftechn. 2000, 31, 872.
4. Gao, Y.; Zhang, Z.; Xue, Q. Mater. Res. Bull. 1999, 34, 1867.
5. Dawson, D. History of Tribology; Longman Group: London, 1979.
6. Somorjai, G. A. Surface Chemistry. In The New Chemistry; Hall, N., Ed.; Cambridge University Press: Cambridge, 2000.
7. Fields, E. K. Ind. Eng. Chem. 1957, 49, 1361.
8. Hipler, F.; Winter, M.; Fischer, R. A. J. Mol. Struct. 2003, in print.
9. Schreiber, F. Prog. Surf. Sci. 2000, 65, 151.
10. Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Scuseria, G. E.; Robb, M. A.; Cheeseman, J. R.; Zakrzewski, V. G.; Montgomery, B. A., Jr.; Stratmann, R. E.; Burant, J. C.; Dapprich, S.; Millam, J. M.; Daniels, A. D.; Kudin, K. N.; Strain, M. C.; Farkas, O.; Tomasi, J.; Barone, V.; Cossi, M.; Cammi, R.; Mennucci, B.; Pomelli, C.; Adamo, C.; Clifford, S.; Ochterski, J.; Petersson, G. A.; Ayala, P. Y.; Cui, Q.; Morokuma, K.; Malick, D. K.; Rabuck, A. D.; Raghavachari, K.; Foresman, J. B.; Cioslowski, J.; Ortiz, J. V.; Baboul, A. G.; Stefanov, B. B.; Liu, G.; Liashenko, A.; Piskorz, P.; Komaromi, I.; Gomperts, R.; Martin, R. L.; Fox, D. J.; Keith, T.; Al-Laham, M. A.; Peng, C. Y.; Nanayakkara, A.; Gonzalez, C.; Challacombe, M.; Gill, P. M. W.; Johnson, B.; Chen, W.; Wong, M. W.; Andres, J. L.; Gonzalez, C.; Head-Gordon, M.; Replogle, E. S.; Pople, J. A. Caussian 98, Revision A.7; Gaussian, Inc.: Pittsburgh, PA, 1998.
11. Poirier, G. E. Chem. Rev. 1997, 97, 1117.
12. Edinger, K.; Gölzhäuser, A.; Demota, K.; Wöll, Ch.; Grunze, M. Langmuir 1993, 9, 4.
13. Edinger, K.; Grunze, M.; Wöll, Ch.;, Ber. Bunsen-Ges. Phys. Chem. 1997, 101, 1811.
14. Fuxen, C.; Azzam, W.; Arnold, R.; Witte, G.; Terfort, A.; Wöll, Ch. Langmuir 2001, 17, 3689.
15. Scofield, J. H. J. Electron Spectrosc. 1976, 8, 129.
16. Cimino, A.; Gazzoli, D.; Valigi, M. J. Electron Spectrosc. Relat. Phenom. 1999, 704, 1.
17. Gelius, U.; Allan, C. J.; Johansson, G.; Siegbahn, H.; Allison, D. A.; Siegbahn, K. Phys. Scr. 1971, 3, 237.
18. Guimon, C.; Pfister-Guillouzo, G.; Arbelot, M. Tetrahedron 1975, 31, 2769.
19. NEXAFS data were obtained at the synchrotron facility BESSY (I) in Berlin at the beam line HE-TGM2 using a multichamber UHV system equipped with a load lock system.
20. Chabal, Y. J. Surf. Sci. Rep. 1988, 8, 211.
21. Weckenmann, U.; Mittler, S.; Naumann, K.; Fischer, R. A. Langmuir 2002, 18, 5479.
22. Bats, J. W. Acta Crystallogr., Sect. B 1976, 32, 2866.
23. Matsumoto, F.; Ozaki, M.; Inatomi, Y.; Paulson, S. C.; Oyama, N. Langmuir 1990, 15, 857.
24. Tzeng, B.-C.; Schier, A.; Schmidbaur, H. Inorg. Chem. 1999, 38, 3978.
25. Wilton-Ely, J. D. E. T.; Schier, A.; Mitzel, N. W.; Schmidbaur, H. Inorg. Chem. 2001, 40, 6266.
26. Wilton-Ely, J. D. E. T.; Schier, A.; Schmidbaur, H. Organometallics 2001, 20, 1895.
27. Loepp, G.; Vollmer, S.; Witte, G.; Wöll, Ch. Langmuir 1999, 15, 3767.
28. Vollmer, S.; Witte, G.; Wöll, Ch. Langmuir 2001, 17, 7560.
29. Hipler, F.; Fischer, R. A.; Müller, J. J. Chem. Soc., Perkin Trans. 2 2002, 1620.