Probe Radius Compensated by the Multi-Cross Product Method in Freeform Surface Measurement with Touch Trigger Probe CMM

International Journal of Advanced Manufacturing Technology

Volumn 21, Issue 10-11, 2003, Pages 902-909

  Lin, Y C ^a   Sun, W I ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

CMM; Cross product of vectors; Probe radius compensation

Indexed keywords

COMPUTER SIMULATION; ERROR ANALYSIS; SURFACE MEASUREMENT; VECTORS;

PROBE RADIUS COMPENSATION;

COORDINATE MEASURING MACHINES;

EID: 0042823895     PISSN: 02683768     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00170-002-1413-0     Document Type: Article

References (8)

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