C-axis current-voltage characteristics of mesa structures on Bi2Sr2CaCu2O8+δ single crystals fabricated by a simple technique without photolithography

Chinese Physics Letters

Volumn 16, Issue 9, 1999, Pages 686-688

  Feng, Yi Jun ^a   Shan, Wen Lei ^a   You, Li Xing ^a   Zhou, Gan Dong ^a   Ji, Zheng Ming ^a   Kang, Lin ^a   Xu, Wei Wei ^a   Yang, Sen Zu ^a   Wu, Pei Heng ^a   Zhang, Yu Heng ^b  

^a NANJING UNIVERSITY   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CALCIUM COMPOUNDS; CAPACITANCE; COPPER OXIDES; CRYSTAL STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; FABRICATION; JOSEPHSON JUNCTION DEVICES; QUANTUM OPTICS; SINGLE CRYSTALS;

ARGON ION MILLING; CRYSTAL SURFACES; CURRENT-VOLTAGE CHARACTERISTICS; FOUR-PROBE; MESA STRUCTURE; METAL MASKS; PATTERNING PROCESS; PROBE TRANSPORT; SIMPLE++; TRANSPORT MEASUREMENTS;

STRONTIUM COMPOUNDS;

EID: 0042784416     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/16/9/024     Document Type: Article

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