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Volumn 39, Issue 29, 2000, Pages 5360-5366
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Continuous-wave Z-scan measurement of photorefractive SBN:60
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
CRYSTALS;
DATA ACQUISITION;
LASERS;
POLARIZATION;
REFRACTIVE INDEX;
BAND-TRANSPORT MODEL;
PHOTOREFRACTIVE MATERIALS;
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EID: 0042782614
PISSN: 1559128X
EISSN: 21553165
Source Type: Journal
DOI: 10.1364/AO.39.005360 Document Type: Article |
Times cited : (4)
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References (8)
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