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Volumn 251, Issue 5, 1999, Pages 340-345
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Impurity effect on low-temperature polarisation of the charge-density-waves in o-TaS3
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Author keywords
Charge density waves; Creep; Dielectric relaxation; Glass transition; Pinning
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Indexed keywords
ACTIVATION ENERGY;
CHARGE DENSITY;
CREEP;
CRYSTAL IMPURITIES;
DIELECTRIC RELAXATION;
DOPING (ADDITIVES);
GLASS TRANSITION;
TEMPERATURE DISTRIBUTION;
CHARACTERISTIC TIME;
DIELECTRIC ANOMALY;
DIELECTRIC RESPONSE;
DOPED CRYSTALS;
IMPURITY EFFECT;
LOW TEMPERATURES;
PINNING;
TEMPERATURE DEPENDENCE;
CHARGE DENSITY WAVES;
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EID: 0042782223
PISSN: 03759601
EISSN: None
Source Type: Journal
DOI: 10.1016/S0375-9601(98)00911-6 Document Type: Article |
Times cited : (2)
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References (21)
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