Femtosecond time-resolved dielectric function measurements by dual-angle reflectometry

Review of Scientific Instruments

Volumn 74, Issue 7, 2003, Pages 3413-3422

  Roeser, C A D ^a   Kim, A M T ^a   Callan, J P ^a   Huang, L ^a   Glezer, E N ^a   Siegal, Y ^a   Mazur, E ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED RADIATION; OPTICAL RESOLVING POWER; PHOTONS; REFLECTOMETERS; ULTRAVIOLET RADIATION;

DIELECTRIC FUNCTIONS;

PERMITTIVITY;

EID: 0042768149     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1582383     Document Type: Article

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