Morphology and luminescence of poly (p-phenylene vinylene) films prepared by chemical vapor deposition

Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

Volumn 377, Issue , 2002, Pages 169-172

  Zhong, Guolun ^a   Kim, Kyungkon ^a   Ahn, Dongjune ^a   Kim, Taeyoung ^a   Jin, Jung Il ^a  

^a Korea University   (South Korea)

Author keywords

Atomic force microscopy; Chemical vapor deposition; Photoluminescence; PPV; Reflective IR; Silicon wafer

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CRYSTALLINE MATERIALS; IMAGE ANALYSIS; PHOTOLUMINESCENCE; QUARTZ; SILICON WAFERS; SPECTRUM ANALYSIS; SUBSTRATES;

INCIDENT ANGLES; PPV; REFLECTIVE IR; TOPOGRAPHIC IMAGES;

THIN FILMS;

EID: 0042758868     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587250290088816     Document Type: Conference Paper

References (3)

1. D, Braun, and A. J. Heeger, Appl. Phys. Lett., 58, 1982 (1991).
2. K. Kim and J.-I. Jin, Nano Lett., in press.
3. K. M. Vaeth and K. F. Jensen, Macromolecules. 31, 6789 (1998).