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Volumn 2998, Issue , 1997, Pages 93-99

Investigation of defects in highly photosensitive germanosilicate thin films

Author keywords

Germanosilicate; Glass; Photosensitivity; Reactive atmosphere sputtering; Thin films

Indexed keywords

ABSORPTION SPECTROSCOPY; CHARGE TRAPPING; DANGLING BONDS; DEFECTS; ELECTRON RESONANCE; ELECTRON SPIN RESONANCE SPECTROSCOPY; FILMS; GERMANIUM; GLASS; HYDROGEN; HYDROGEN STORAGE; LIGHT SENSITIVE MATERIALS; MATERIALS; OPTICAL MATERIALS; OXYGEN; PARAMAGNETIC MATERIALS; PARAMAGNETIC RESONANCE; PARAMAGNETISM; PHOTOSENSITIVITY; POINT DEFECTS; REFRACTIVE INDEX; SOLIDS; SPIN DYNAMICS; THIN FILMS;

EID: 0042754941     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.264170     Document Type: Conference Paper
Times cited : (6)

References (18)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.