Modeling reliability growth during non-representative testing

Annals of Software Engineering

Volumn 4, Issue , 1997, Pages 11-29

  Mitchell, Brian ^a   Zeil, Steven J ^a  

^a ECS Building   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042735549     PISSN: 10227091     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1018970928797     Document Type: Article

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