The role of topological phases in the microinterferogram formation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2778, Issue PART 2, 1996, Pages 1072-1073

  Tavrov, A V ^a   Andreev, V A ^b   Ublinsky, D V ^a   Orlov, D A ^a   Kogan, K A ^a  

^a Nanotech Company Ltd   (Russian Federation)

^b PNLcbcdcv Physical Inst   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROGRAMS; MICROINTERFEROGRAMS; REAL TIME; SURFACE MONITORING; TOPOLOGICAL PHASIS;

TOPOLOGY;

OPTICS;

EID: 0042732457     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. H.Jiao, S.R Wilkinson, R.Chiao, H.Nathel, Phys. Rev. A 39, 3475 (1989).
2. A Bergamin, G Cavagnero, G.Mana, J. Mod. Optics 39, 2053 (1992).
3. M.Born, E.Wolf, Principles of Optics. Pergamon Press, NY., 1968, Ch. 7.5.
4. P.Hariharan, K G.Larkin, M Roy, J. Mod Optics 41, 663 (1994).