Verifying the diode-capacitor circuit voltage decay

American Journal of Physics

Volumn 71, Issue 8, 2003, Pages 797-800

  Hellen, Edward H ^a  

^a UNIVERSITY OF NORTH CAROLINA AT GREENSBORO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042730181     PISSN: 00029505     EISSN: None     Source Type: Journal    
DOI: 10.1119/1.1578070     Document Type: Article

References (8)

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3. J. W. Precker and M. A. da Silva, "Experimental estimation of the band gap in silicon and germanium from the temperature-voltage curve of diode thermometers," Am. J. Phys. 70 (11), 1150-1153 (2002).
4. C. Kittel, Introduction to Solid State Physics (Wiley, New York, 1968), 3rd ed., pp. 324-329.
5. K. Krane, Modern Physics (Wiley, New York, 1996), 2nd ed., pp. 362-365.
6. A. de Sa, Electronics for Scientists (Prentice-Hall, London, 1997), pp. 58-61.
7. J. Millman and C. C. Halkias, Electronic Devices and Circuits (McGraw-Hill, New York, 1967), pp. 124-129.
8. B. D. Sukheeja, "Measurement of the band gap in silicon and germanium," Am. J. Phys. 51 (1), 72 (1983).