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Volumn 44, Issue 8, 2003, Pages 3309-3340
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Extended resolvent and inverse scattering with an application to KPI
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0042729994
PISSN: 00222488
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1587874 Document Type: Article |
Times cited : (17)
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References (18)
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