London Penetration Depth Measurement Using a SQUID Microscope

Journal of Low Temperature Physics

Volumn 114, Issue 3-4, 1999, Pages 277-284

  Obukhov, Yu V ^a  

^a JOINT INSTITUTE FOR NUCLEAR RESEARCH   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042729641     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1022586500043     Document Type: Article

References (13)

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