Micropipe defects and voids at β-SiC/Si(100) interfaces

Diamond and Related Materials

Volumn 6, Issue 10, 1997, Pages 1365-1368

  Scholz, R ^a   Gosele U ^a   Niemann, E ^b   Leidich, D ^b   Wischmeyer, F ^b  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b DAIMLER AG   (Germany)

Author keywords

Carbonization; Electron microscopy; Micropipes; Silicon carbide

Indexed keywords

EID: 0042728311     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(97)00095-2     Document Type: Article

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