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Volumn 69, Issue 17, 1996, Pages 2572-2574

Microstructural development and optical properties of epitaxial Ge1-xCx alloys on Si(100)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0042707500     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117703     Document Type: Article
Times cited : (30)

References (18)
  • 1
    • 28644437838 scopus 로고
    • See for example, J. C. Bean, Proc. IEEE 80, 571 (1992); T. P. Pearsall, Crit. Rev. Solid State Mater. Sci. 15, 551 (1989).
    • (1992) Proc. IEEE , vol.80 , pp. 571
    • Bean, J.C.1
  • 3
    • 0027887558 scopus 로고
    • For a review see R. A. Soref, Proc. IEEE 81, 1687 (1993).
    • (1993) Proc. IEEE , vol.81 , pp. 1687
    • Soref, R.A.1
  • 14
    • 0004017086 scopus 로고
    • J. A. Woolam Co.
    • See, for example, Guide to Using WVASE32, (J. A. Woolam Co., 1995).
    • (1995) Guide to Using WVASE32
  • 17
    • 0003813180 scopus 로고
    • edited by J. W. Matthews Academic, New York
    • See, for example, M. J. Stowell, in Epitaxial Growth, Part B, edited by J. W. Matthews (Academic, New York, 1975).
    • (1975) Epitaxial Growth, Part B
    • Stowell, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.