A deep semiconductor defect with continuously variable activation energy and capture cross section

Applied Physics Letters

Volumn 75, Issue 2, 1999, Pages 277-279

  Lourenco M A ^a   Ng, Wai Lek ^a   Homewood, K P ^a   Durose, K ^b  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b DURHAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042707074     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124347     Document Type: Article

References (13)

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