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Volumn 42, Issue 6, 2003, Pages 1694-1698

Fourier transform method for measurement of thin film thickness by speckle interferometry

Author keywords

Fourier transforms; Speckle interferometry; Thin films

Indexed keywords

ALUMINUM; CAMERAS; CHARGE COUPLED DEVICES; FOURIER TRANSFORMS; LIGHT INTERFERENCE; SPECKLE; THICKNESS MEASUREMENT; THIN FILMS;

EID: 0042699879     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1572498     Document Type: Article
Times cited : (11)

References (14)
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    • Fourier transform method of fringe pattern analysis for computer based topography and interferometry
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.