Surface modification of Nb-films during hydrogen loading

Journal of Alloys and Compounds

Volumn 356-357, Issue , 2003, Pages 541-544

  Nörthemann, Kai ^a   Kirchheim, Reiner ^a   Pundt, Astrid ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Scanning tunneling microscopy; Thin films

Indexed keywords

DISLOCATIONS (CRYSTALS); INTERFACES (MATERIALS); NIOBIUM; SCANNING TUNNELING MICROSCOPY; STRESSES; SURFACE TREATMENT;

HYDROGEN LOADING;

THIN FILMS;

EID: 0042698476     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(02)01259-8     Document Type: Conference Paper

References (14)

1. Witvrouw A., Spaepen F. J. Appl. Phys. 73:(11):1993;7344-7350.
2. Laudahn U., Pundt A., Bicker M., von Hülsen U., Geyer U., Wagner T., Kirchheim R. J. Alloys Comp. 295:1999;490-494.
3. Pundt A., Getzlaff M., Bode M., Kirchheim R., Wiesendanger R. Phys. Rev. B. 61:2000;9964.
4. Laudahn U., Fähler S., Krebs H.U., Pundt A., Bicker M., Hülsen U.V., Geyer U., Kirchheim R. Appl. Phys. Lett. 74:(5):1999;647-649.
5. Zabel H., Weidinger A. Commun. Cond. Matter Phys. 5:1995;239.
6. Yang D., Schmitz G., Fähler S., Krebs H.U., Kirchheim R. Phys. Rev. B. 54:1996;9131.
7. Wildes A.R., Meyer J., Theis-Bröhl K. Thin Solid Films. 401:(1-2):2001;7-34.
8. Oderno V., Dupour C., Dumesnil K., Mougan A., Mangin P., Marchal G. Phil. Mag. Lett. 78:(5):1998;419-426.
9. Yoshii K., Yamamoto H., Saiki K., Koma A. Phys. Rev. B. 52:(18):1995;13570-13575.
10. Crank J. The Mathematics of Diffusion. 2nd Edition: 1975;Clarendon Press, Oxford.
11. Qi Z., Völkl J., Lässer R., Wenzl H. J. Phys. F. 13:1983;2053-2062.
12. Stoney G.G. Proc. R. Soc. A. 82:1909;172.
13. S. Roberts, Microplasticity, http://users.ox.ac.uk/̃roberts/sgrgroup/lectures/microplast/microplast_main .htm (2000).
14. Nagengast D.G., Kerssemakers J.W.J., van Gogh A.T.M., Dam B., Griessen R. Appl. Phys. Lett. 75:(12):1999;1724-1726.