Position-dependent texture analysis of melt-textured YBCO by means of electron backscatter diffraction

Physica C: Superconductivity and its Applications

Volumn 392-396, Issue PART 1, 2003, Pages 607-612

  Koblischka Veneva, A ^a   Koblischka, M R ^a   Ogasawara, K ^b   Murakami, M ^b  

^a SAARLAND UNIVERSITY   (Germany)

^b ISTEC   (Japan)

Author keywords

Automated mapping; Bulk high Tc superconductors; Ceramics; EBSD; Electron backscatter diffraction; SEM

Indexed keywords

BACKSCATTERING; CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; TEXTURES;

AUTOMATED MAPPING;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0042691360     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(03)00860-8     Document Type: Conference Paper

References (15)

1. Murakami M. Murakami M. Melt Processed High Temperature Superconductors. 1993;World Scientific, Singapore.
2. Ogasawara K., Sakai N., Murakami M. Supercond. Sci. Technol. 13:2000;688.
3. Diko P. Supercond. Sci. Technol. 13:2000;1202.
4. Dingley D.J., Randle V. J. Mater. Sci. 27:1992;4585.
5. Schwarzer R.A. Mat. Sci. Forum. 287-288:1998;23.
6. Fujimoto T., Mitsuru M., Masahashi N., Kaneko T. IOP Conf. Ser. 167. vol. 1:2000;79.
7. A. Koblischka-Veneva, M.R. Koblischka, in: Proc. MOS conference, 13.8.-18.8.2002, Hsinchu, Taiwan, J. Low Temp. Phys. (in press).
8. Koblischka-Veneva A., Koblischka M.R., Simon P., Mücklich F., Murakami M. Supercond. Sci. Technol. 15:2002;796.
9. Koblischka-Veneva A., Koblischka M.R., Simon P., Mücklich F., Murakami M. Physica C. 382:2002;311.
10. Murakami M., Sakai N., Higuchi T., Yoo S.I. Supercond. Sci. Technol. 9:1996;1015.
11. Orientation Imaging Microscopy (OIM) software version V2.6, user manual, TexSEM Laboratories (TSL), Draper, UT.
12. Sandiumenge F., Pinol S., Obradors X., Snoeck E., Roucau C. Phys. Rev. B. 50:1994;7032.
13. M.R. Koblischka, A. Koblischka-Veneva, E.S. Reddy, G.J. Schmitz, K. Ogasawara, M. Murakami, Physica C (2003), these Proceedings.
14. Kim C.J., Kim K.B., Hong G.W., Lee H.Y. J. Mater. Res. 10:1995;1605.
15. Endo A., Chauhan H.S., Egi T., Shiohara Y. J. Mater. Res. 11:1996;795.